Chemically resolved electrical measurements using x-ray photoelectron spectroscopy
نویسندگان
چکیده
منابع مشابه
Time resolved photoelectron spectroscopy with ultrafast soft x-ray light
2001 This thesis entitled: Time resolved photoelectron spectroscopy with ultrafast soft x-ray light written by Lora Nugent-Glandorf has been approved for the Department of Chemistry and Biochemistry Date The final copy of this thesis has been examined by the signatories, and we find that both the content and the form meet acceptable presentation standards of scholarly work in the above mentione...
متن کاملHighly sensitive nitric oxide detection using X-ray photoelectron spectroscopy.
Nitric oxide (NO) is important physiologically as a gaseous messenger in the central nervous system;1 its level is also associated with several disease states.2 The concentration of NO in these cases is in the nanomolar range; therefore accurate and direct detection of NO at these levels is important. NO is also a decomposition product of several explosives3 so detection of trace amounts of exp...
متن کاملX - Ray Photoelectron Spectroscopy of Silicate Glasses
X-ray photoelectron spectroscopy (XPS) is a powerful technique capable of providing unique information about the structural chemistry of glasses. However, inappropriate procedures for the preparation of sample surfaces or the lack of reliable methods to overcome electrostatic charging effects during analysis of dielectric materials can cause spurious features to be introduced or intrinsic featu...
متن کاملAn Angle-Resolved Photoelectron Spectroscopy and Near-Edge X-ray Absorption Fine Structure Study
The nature of the surface formed by a saturated layer (8(NO) = 1.0) of NO on a Mo(100) surface at 150 K has been determined by using both angle-resolved ultraviolet photoelectron spectroscopy and the angular variation of near-edge X-ray absorption fine structure (NEXAFS). Photoelectron spectroscopy indicates that NO can adsorb molecularly at this temperature but that a portion of the NO is also...
متن کاملIdentification of Secondary Phases in Cu2ZnSnS4 Layers by In-depth Resolved X-ray Photoelectron Spectroscopy Analysis
A Cu2ZnSnS4 (CZTS) film with a thickness of approximately 1.5 μm was fabricated on a Mo-coated glass substrate by annealing a CZTS precursor fabricated from nanoparticle ink. The chemical states of the elements in the CZTS thin film in the depth direction were studied to identify the presence of secondary phases, which are detrimental to the performance of solar cells containing CZTS. X-ray dif...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2004
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.1782261